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Microscopie à sonde à balayage : ingénierie à l'échelle atomique par forces et courants par annonce-
186,60 USD
Environ167,62 EUR
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- Achat immédiatMicroscopie à sonde à balayage : ingénierie à l'échelle atomique par forces et courants par annonce
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Lieu où se trouve l'objet : Fairfield, Ohio, États-Unis
Délai de livraison :
Estimé entre le mar. 8 oct. et le mar. 15 oct. à 43230
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Numéro de l'objet eBay :395157057835
Dernière mise à jour le 22 sept. 2024 18:41:11 Paris. Afficher toutes les modificationsAfficher toutes les modifications
Caractéristiques de l'objet
- État
- ISBN-13
- 9781441923066
- Book Title
- Scanning Probe Microscopy
- ISBN
- 9781441923066
- Subject Area
- Technology & Engineering, Science
- Publication Name
- Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
- Publisher
- Springer New York
- Item Length
- 9.3 in
- Subject
- Materials Science / General, Nanoscience, Electron Microscopes & Microscopy, Nanotechnology & Mems
- Publication Year
- 2010
- Series
- Nanoscience and Technology Ser.
- Type
- Textbook
- Format
- Trade Paperback
- Language
- English
- Item Weight
- 16.1 Oz
- Item Width
- 6.1 in
- Number of Pages
- Xiv, 282 Pages
À propos de ce produit
Product Identifiers
Publisher
Springer New York
ISBN-10
1441923063
ISBN-13
9781441923066
eBay Product ID (ePID)
109176802
Product Key Features
Number of Pages
Xiv, 282 Pages
Language
English
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Subject
Materials Science / General, Nanoscience, Electron Microscopes & Microscopy, Nanotechnology & Mems
Publication Year
2010
Type
Textbook
Subject Area
Technology & Engineering, Science
Series
Nanoscience and Technology Ser.
Format
Trade Paperback
Dimensions
Item Weight
16.1 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
Dewey Edition
22
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
502.82
Table Of Content
The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Synopsis
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data., Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data. Key Features Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy Provides a framework for linking scanning probe theory and simulations with experimental data Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations
LC Classification Number
TA418.5-.84
Description de l'objet fournie par le vendeur
Informations sur le vendeur professionnel
Premier Books LLC
David Taylor
26C Trolley Sq
19806-3356 Wilmington, DE
United States
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Évaluations en tant que vendeur (1 032 765)
- l***c (227)- Évaluations laissées par l'acheteur.Dernier moisAchat vérifiéBook came packaged well to avoid damage, in great condition. Not sure if the seller delayed shipping or if usps didn’t update the shipping, which is highly likely. Still received and we are happy with our purchase. I had trouble looking up tracking due to the company they used but seller found usps tracking and sent that over quickly. Sellers communication was excellent. Would buy from again. Item as described.
- t***n (2908)- Évaluations laissées par l'acheteur.Dernier moisAchat vérifiéI don't give negatives; However, description was not correct; No price guide was included in this book.As you will see in book pic shown; title states price guide included, no price guide inside. Communication poor, description, no communication price guide missing from this book. Shipping time was weeks before it was even shipped. Blamed the shipping on warehouse. You own & operate a business; your warehouse is not up to standards you change who you do business with. It's your responsibility.
- -***6 (133)- Évaluations laissées par l'acheteur.6 derniers moisAchat vérifiéItem arrived as described and adequately packaged. Ridiculously long shipping time. Seller posts incorrect tracking number and lists the item as shipped. Contacted seller for correct tracking, received a new tracking number with the warning that the number won’t be “live” until the item is shipped. Will you get your item? Yeah, probably. Count on it being delivered 2-3 weeks longer than expected.
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