Photo 1/1
Photo 1/1
Spectroscopies ioniques pour analyse de surface par Alvin W. Czanderna (anglais) Hardcove-
112,58 USD
Environ101,03 EUR
État :
Neuf
Livre neuf, n'ayant jamais été lu ni utilisé, en parfait état, sans pages manquantes ni endommagées. Consulter l'annonce du vendeur pour avoir plus de détails.
3 disponibles
- Achat immédiatSpectroscopies ioniques pour analyse de surface par Alvin W. Czanderna (anglais) Hardcove
Livraison :
Gratuit Economy Shipping.
Lieu où se trouve l'objet : Fairfield, Ohio, États-Unis
Délai de livraison :
Estimé entre le lun. 7 oct. et le sam. 12 oct. à 43230
Retours :
Retour sous 30 jours. L'acheteur paie les frais de retour.
Paiements :
Achetez en toute confiance
Le vendeur assume l'entière responsabilité de cette annonce.
Numéro de l'objet eBay :395142222067
Dernière mise à jour le 22 sept. 2024 06:13:07 Paris. Afficher toutes les modificationsAfficher toutes les modifications
Caractéristiques de l'objet
- État
- ISBN-13
- 9780306437922
- Book Title
- Ion Spectroscopies for Surface Analysis
- ISBN
- 9780306437922
- Subject Area
- Science
- Publication Name
- Ion Spectroscopies for Surface Analysis
- Publisher
- Springer
- Item Length
- 9 in
- Subject
- Physics / Condensed Matter, Spectroscopy & Spectrum Analysis, Chemistry / Physical & Theoretical, Chemistry / Analytic
- Publication Year
- 1991
- Series
- Methods of Surface Characterization Ser.
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Weight
- 31.4 Oz
- Item Width
- 6 in
- Number of Pages
- Xvii, 469 Pages
À propos de ce produit
Product Identifiers
Publisher
Springer
ISBN-10
0306437929
ISBN-13
9780306437922
eBay Product ID (ePID)
133036
Product Key Features
Number of Pages
Xvii, 469 Pages
Publication Name
Ion Spectroscopies for Surface Analysis
Language
English
Subject
Physics / Condensed Matter, Spectroscopy & Spectrum Analysis, Chemistry / Physical & Theoretical, Chemistry / Analytic
Publication Year
1991
Type
Textbook
Subject Area
Science
Series
Methods of Surface Characterization Ser.
Format
Hardcover
Dimensions
Item Weight
31.4 Oz
Item Length
9 in
Item Width
6 in
Additional Product Features
Intended Audience
College Audience
LCCN
91-019636
Dewey Edition
20
Series Volume Number
2
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
541.3/3
Table Of Content
1. Overview of Ion Spectroscopies for Surface Compositional Analysis.- Glossary of Acronyms.- 1. Purposes.- 2. Introduction.- 3. Overview of Compositional Surface Analysis by Ion Spectroscopies.- 4. Ion Spectroscopies Using Ion Stimulation.- 5. Ion Spectroscopies Using Ion Detection.- References.- 2. Surface Structure and Reaction Studies by Ion-Solid Collisions.- 1. Introduction.- 2. The Experimental Approach.- 3. How to View the Process.- 4. Electronic Effects.- 5. Surface Characterization with Ion Bombardment.- 6. Conclusions and Prospects.- References.- 3. Particle-Induced Desorption Ionization Techniques for Organic Mass Spectrometry.- 1. Introduction.- 2. Spectral Effects of Primary Beam Parameters.- 3. Properties of Secondary Ions.- 4. Sample Preparation.- 5. Special Techniques.- 6. Future Prospects.- References.- 4. Laser Resonant and Nonresonant Photoionization of Sputtered Neutrals.- Glossary of Symbols and Acronyms.- 1. Introduction.- 2. Photoionization.- 3. Experimental Details.- 4. Artifacts, Quantitation, Capabilities, and Limitations.- 5. Applications.- 6. Future Directions.- 7. Summary.- References.- 5. Rutherford Backscattering and Nuclear Reaction Analysis.- 1. Introduction.- 2. Principles of the Methods.- 2. Apparatus.- 4. Quantitative Analysis and Sensitivity.- 5. Ion Scattering as a Structural Tool.- 6. Applications.- 7. Outstanding Strengths of RBS in Relation to AES, XPS, and SIMS.- References.- 6. Ion Scattering Spectroscopy.- 1. Introduction.- 2. Basic Principles.- 3. Experimental Techniques.- 4. Calculations.- 5. Analysis of Surface Composition.- 6. Structure of Crystalline Surfaces.- References.- 7. Comparison of SIMS, SNMS, ISS, RBS, AES, and XPS Methods for Surface Compositional Analysis.- 1. Purpose.- 2. Introduction.- 3. Comparison Categories or Criteria.- 4. The Surface Analysis Community.- References.- Standard Terminology Relating to Surface Analysis.- Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces.- Standard Guide for Specimen Handling in Auger Electron Spectroscopy, X-Ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry.- Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS).
Synopsis
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals., Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap- proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita- tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.
LC Classification Number
QD71-142
Description de l'objet fournie par le vendeur
Informations sur le vendeur professionnel
Premier Books LLC
David Taylor
26C Trolley Sq
19806-3356 Wilmington, DE
United States
Je certifie que toutes mes activités de vente seront conformes à toutes les lois et réglementations de l'UE.
Catégories populaires de cette Boutique
Inscrit comme vendeur professionnel
Évaluations en tant que vendeur (1 032 620)
- l***c (227)- Évaluations laissées par l'acheteur.Dernier moisAchat vérifiéBook came packaged well to avoid damage, in great condition. Not sure if the seller delayed shipping or if usps didn’t update the shipping, which is highly likely. Still received and we are happy with our purchase. I had trouble looking up tracking due to the company they used but seller found usps tracking and sent that over quickly. Sellers communication was excellent. Would buy from again. Item as described.
- t***n (2903)- Évaluations laissées par l'acheteur.Dernier moisAchat vérifiéI don't give negatives; However, description was not correct; No price guide was included in this book.As you will see in book pic shown; title states price guide included, no price guide inside. Communication poor, description, no communication price guide missing from this book. Shipping time was weeks before it was even shipped. Blamed the shipping on warehouse. You own & operate a business; your warehouse is not up to standards you change who you do business with. It's your responsibility.
- -***6 (133)- Évaluations laissées par l'acheteur.6 derniers moisAchat vérifiéItem arrived as described and adequately packaged. Ridiculously long shipping time. Seller posts incorrect tracking number and lists the item as shipped. Contacted seller for correct tracking, received a new tracking number with the warning that the number won’t be “live” until the item is shipped. Will you get your item? Yeah, probably. Count on it being delivered 2-3 weeks longer than expected.
Notes et avis sur le produit
Rédigez un avis en premier.