|Mis en vente dans la catégorie :
Envoi et livraisonCliquez sur Afficher les détails pour obtenir des informations supplémentaires sur la livraison et les retours.
Vous en avez un à vendre ?

Advances in X-Ray Analysis : Proceedings of the, Newkirk, Mallett, Pfeiffer-,-

Texte d'origine
Advances in X-Ray Analysis: Proceedings of the , Newkirk, Mallett, Pfeiffer-,
Awesomebooksusa
  • (419256)
  • Inscrit comme vendeur professionnel
283,42 USD
Environ253,81 EUR
État :
Neuf
3 disponibles
Livraison :
Gratuit USPS Media MailTM.
Lieu où se trouve l'objet : MD, États-Unis
Délai de livraison :
Estimé entre le lun. 7 oct. et le ven. 11 oct. à 43230
Les dates de livraison estimées - la page s'ouvre dans une nouvelle fenêtre ou un nouvel onglet prennent en compte le délai d'expédition indiqué par le vendeur, le code postal de l'expéditeur, le code postal du destinataire et la date d'acceptation de l'offre. Elles dépendent du service de livraison sélectionné et de la date de réception du paiementréception du paiement - la page s'ouvre dans une nouvelle fenêtre ou un nouvel onglet. Les délais de livraison peuvent varier, notamment pendant les périodes de pointe.
Retours :
Retour sous 30 jours. L'acheteur paie les frais de retour.
Paiements :
    

Achetez en toute confiance

Garantie client eBay
Obtenez un remboursement si vous ne recevez pas l'objet que vous avez commandé. En savoir plusGarantie client eBay - la page s'ouvre dans une nouvelle fenêtre ou un nouvel onglet
Le vendeur assume l'entière responsabilité de cette annonce.
Numéro de l'objet eBay :335221339521
Dernière mise à jour le 26 sept. 2024 19:28:36 Paris. Afficher toutes les modificationsAfficher toutes les modifications

Caractéristiques de l'objet

État
Neuf: Livre neuf, n'ayant jamais été lu ni utilisé, en parfait état, sans pages manquantes ni ...
PublishedOn
2013-10-10
Title
Advances in X-Ray Analysis: Proceedings of the Sixteenth Annual
ISBN
9781468486780
Subject Area
Science
Publication Name
Advances in X-Ray Analysis : Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11
Publisher
Springer
Item Length
10 in
Subject
Spectroscopy & Spectrum Analysis, Physics / Optics & Light, Chemistry / Physical & Theoretical
Publication Year
2013
Type
Textbook
Format
Trade Paperback
Language
English
Author
Gavin R. Mallett, John B. Newkirk, Heinz G. Pfeiffer
Item Weight
34.3 Oz
Item Width
7 in
Number of Pages
Xi, 499 Pages

À propos de ce produit

Product Identifiers

Publisher
Springer
ISBN-10
1468486780
ISBN-13
9781468486780
eBay Product ID (ePID)
203398037

Product Key Features

Number of Pages
Xi, 499 Pages
Language
English
Publication Name
Advances in X-Ray Analysis : Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11
Subject
Spectroscopy & Spectrum Analysis, Physics / Optics & Light, Chemistry / Physical & Theoretical
Publication Year
2013
Type
Textbook
Author
Gavin R. Mallett, John B. Newkirk, Heinz G. Pfeiffer
Subject Area
Science
Format
Trade Paperback

Dimensions

Item Weight
34.3 Oz
Item Length
10 in
Item Width
7 in

Additional Product Features

Intended Audience
Scholarly & Professional
Number of Volumes
1 vol.
Illustrated
Yes
Table Of Content
Recent Advances in Quantitative X-Ray Spectrometric Analysis by Solution Techniques.- X-Ray Fluorescence Spectroscopy in the Analysis of Ores, Minerals, and Waters.- Common Sources of Error in Electron Probe Microanalysis.- X-Ray Spectrographic Analysis of Traces in Metals by Preconcentration Techniques.- Theoretical Correction for Coexistent Elements in Fluorescent X-Ray Analysis of Alloy Steel.- Micro Fluorescent X-Ray Analyzer.- Use of Primary Filters in X-Ray Spectrography: A New Method for Trace Analysis.- Precision and Accuracy of Silicate Analyses by X-Ray Fluorescence.- Applications of Computerized Statistical Techniques in Quantitative X-Ray Analysis.- X-Ray Fluorescence Analysis of a Manganese Ore.- Total Nondestructive Analysis of CAAS Syenite.- X-Ray Fluorescence of Suspended Particles in a Liquid Hydrocarbon.- The Effect of Surface Roughness in Polymers on X-Ray Fluorescence Intensity Measurements.- Production Control of Gold and Rhodium Plating Thickness on Very Small Samples by X-Ray Spectroscopy.- A Study of X-Ray Fluorescence Method with Vacuum and Air-Path Spectrographs for the Determination of Film Thicknesses of II-VI Compounds.- Rare-Earth Analyses by X-Ray-Excited Optical Fluorescence.- Nondispersive X-Ray Fluorescent Spectrometer.- The Influence of Sample Self-Absorption on Wavelength Shifts and Shape Changes in the Soft X-Ray Region: The Rare-Earth M Series.- The X-Ray Wavelength Scale in the Long-Wavelength Region.- Applications of a Portable Radioisotope X-Ray Fluorescence Spectrometer to Analysis of Minerals and Alloys.- The Application of Radioisotope Nondispersive X-Ray Spectrometry to the Analysis of Molybdenum.- Quantitative Microprobe Analysis of Thin Insulating Films.- The Effect of Microsegregation on the Observed Intensity in Thin-FilmMicroanalysis.- Multistep Intensity Indication in Scanning Microanalysis.- Investigation and Demonstration of Single-Crystal and Powder Diffraction by Using Zero-Power Beta-Excited X-Ray and 55Fe Isotopic Sources.- An X-Ray Small-Angle Scattering Instrument.- Study of Extended X-Ray Absorption Fine Structure with the Use of Thick Targets.- Determination of Lattice Parameters by the Kossel and Divergent X-Ray Beam Techniques.- Fully Automated High-Precision X-Ray Diffraction.- Computerized Multiphase X-Ray Powder-Diffraction Identification System.- Measurement of Elastic Strains in Crystal Surfaces by X-Ray Diffraction Topography.- X-Ray Double-Crystal Method of Analyzing Microstrains with BeO Single Crystals.- X-Ray Stress Measurement by the Single-Exposure Technique.- Residual Stress and Shape Distortion in High-Strength Tool Steels.- Irradiation Effects in Some Crystalline Ceramics.- An X-Ray Diffraction Study of the Aging Reaction in Two Austenitic Alloys.- A Simplified Method of Quantitating Preferred Orientation.- Crystallite Orientation Analysis for Rolled Cubic Materials.- Topotactical Relationships Between Hematite ?-Fe2O3 and the Magnetite Fe3O4 Which is Formed on It by Thermal Decomposition under Low Oxygen Pressure.- Crystal Structure Analysis of Niobium-Doped Rutile Single Crystal.- Author Index.
Synopsis
X-ray emission spectrography, while based on Moseley's work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago. The central theme of this conference, quantitative methods in X-ray spectrometric analy­ sis, and the large number of papers on that subject attest to the growth of the application and usefulness of X-ray emission. It is a privilege to have as an invited speaker Laverne Birks, one of the original group that put X-ray emission into analytical chemistry. Determination of elements above titanium in the periodic table was considered the province of X-ray fluorescence, and most of the early development was aimed at the analy­ sis of alloys. The papers in this volume on metals analysis accept most operational features as routine and have concentrated on the improved treatment of the observed data in order to convert them to more accurate results. As the treatment of matrix effects, geometry, and stability have been better understood, corrections have become routine. For most elements that are present in amounts greater than a few parts per million, determinations can now be done with accuracies rivaling wet methods. Trace quantities are being determined to lower and lower amounts, largely owing to improvement of equipment and development of concentration techniques. For most trace elements, X-ray spectrography has become the preferred analytical method. The develop­ ment of improved methods for separating signals from noise should lead to major reduc­ tions in minimum detection levels., X-ray emission spectrography, while based on Moseley's work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago. The central theme of this conference, quantitative methods in X-ray spectrometric analy- sis, and the large number of papers on that subject attest to the growth of the application and usefulness of X-ray emission. It is a privilege to have as an invited speaker Laverne Birks, one of the original group that put X-ray emission into analytical chemistry. Determination of elements above titanium in the periodic table was considered the province of X-ray fluorescence, and most of the early development was aimed at the analy- sis of alloys. The papers in this volume on metals analysis accept most operational features as routine and have concentrated on the improved treatment of the observed data in order to convert them to more accurate results. As the treatment of matrix effects, geometry, and stability have been better understood, corrections have become routine. For most elements that are present in amounts greater than a few parts per million, determinations can now be done with accuracies rivaling wet methods. Trace quantities are being determined to lower and lower amounts, largely owing to improvement of equipment and development of concentration techniques. For most trace elements, X-ray spectrography has become the preferred analytical method. The develop- ment of improved methods for separating signals from noise should lead to major reduc- tions in minimum detection levels.
LC Classification Number
QD450-882

Description de l'objet fournie par le vendeur

Informations sur le vendeur professionnel

WRAP Ltd
Mubin Ahmed
2 Lester Way
Wallingford
OX10 9TA
United Kingdom
Afficher les coordonnées
: liam-e esserdAku.oc.skoobemosewa@asuyabe
Numéro de TVA :
  • GB 724498118
Numéro d'immatriculation de la société :
  • 03800600
Je certifie que toutes mes activités de vente seront conformes à toutes les lois et réglementations de l'UE.
Numéro CRN :
  • 03800600
Awesomebooksusa

Awesomebooksusa

98% d'évaluations positives
1,3 millions objets vendus
Visiter la BoutiqueContacter
Membre depuis mars 2009

Évaluations détaillées du vendeur

Moyenne pour les 12 derniers mois
Description exacte
4.8
Frais de livraison raisonnables
5.0
Livraison rapide
4.9
Communication
5.0

Catégories populaires de cette Boutique

Inscrit comme vendeur professionnel

Évaluations en tant que vendeur (521 292)

  • _***d (6)- Évaluations laissées par l'acheteur.
    Dernier mois
    Achat vérifié
    El artículo correspondía al de la descripción. Llegó quizá en un bolsa con poca protección por lo que el libro llegó con daños en la cubierta. Hablé con el vendedor y me ofreció muy amablemente un reembolso. Muy contento con el vendedor.
  • l***c (29)- Évaluations laissées par l'acheteur.
    Dernier mois
    Achat vérifié
    Item in condition described. The shipment tracking was completely opaque and shipping was slow. The seller used a third-party shipping solution provider that gave a USPS tracking number, but, USPS had no real tracking info. I was not able to see any delivery estimate until the day before it arrived. When the delivery date estimate finally materialized, it was off by two days, saying arrival would be on e.g. the 5th when it actually arrived on the 3rd.
  • b***3 (502)- Évaluations laissées par l'acheteur.
    Dernier mois
    Achat vérifié
    As the title mentions awesomebooksusa, most books have been rarely awesome but the book prices have been almost generous, granted. Unbelievable services : 3 day international shipping, prompt dispatch, newly book condition, provided tracking, secure package, exactly received book, and safe deliveries. My gratitude to the seller’s thoughts of the needy buyers sending the wanted books to the new residence. Many thanks! Arabella

Notes et avis sur le produit

Aucune note ni aucun avis pour ce produit
Rédigez un avis en premier.